Journal of Materials Science Materials in Electronics
Springer Science+Business Media · Netherlands
POSI-J-023464eISSN 0957-4522
Evaluation status
1 · Core Collection
Listed in the journal directory. Certification is by application.
3 · Citation ranking
CITATION-RANK-1.0In Materials Engineering · percentile 51.7
PNCI 0.50 · 8978 eligible items · coverage 100.0%
Snapshot: September 2026
PQF is an eligibility and quality-framework assessment. It is not a citation ranking metric and does not determine Citation Quartiles or POSI Zones. PCS is a supplementary citation indicator and does not determine the official POSI Citation Rank, Citation Percentile, Citation Quartile, or POSI Zone.
Citations and output
- Citation score (PCS)
- 5.75
- Supplementary · 2022–2025 · 8,978 items · PCS-1.0
- Adequate sample
- How it is calculated
- Articles
- 31,444
- OpenAlex / Crossref
- Subject
- Materials Engineering
- P2.05 · confidence high
Ranking history
- 2026currentC-Q2Zone 3
Materials Engineering · rank 259 of 535
Editions are kept as published; each ranks the journal within its category that year.
Record details
Identity
- POSI ID · posi-data registry/ · identifier
- POSI-J-023464
- eISSN · ISSN Portal / Crossref · identifier
- 0957-4522
- OpenAlex source · OpenAlex · identifier
- S189509794
- Title · ISSN Portal / Crossref · registry
- Journal of Materials Science Materials in Electronics
- Publisher · Crossref / OpenAlex · registry
- Springer Science+Business Media
Not recorded: pISSN, ISSN country
Declared by the publisher
Stated by the journal about itself. POSI records these as declared and does not present them as measured.
- Declared country · Publisher · declared
- Netherlands
- Language · Publisher / DOAJ · declared
- English
- Website · Publisher · declared
- www.springer.com/10854
Not recorded: Frequency, License, Peer review, Article processing charge
Registry and computed values
- Open access · DOAJ / OpenAlex · registry
- No
Not recorded: DOAJ status
Verification: Partially verified
ISSN resolved to an OpenAlex source record; journal-level evidence not reviewed by POSI.
Freshness: Current
Updated 2026-08-10. Record updated within 6 months of the data cutoff.
Indexed, benchmark set
Indexed. Also in the Global Benchmark reference set that POSI uses to validate its methodology.
Cite this record
Panorama Open Scholarly Index. (2026). Journal of Materials Science Materials in Electronics [journal record, POSI-J-023464]. https://posi.panorama-sg.com/journal/bench-journal-of-materials-science-materials-i-0149/