Thin Solid Films

Elsevier BV, Netherlands

POSI-J-023392eISSN 0040-6090IndexedPartially verifiedCurrent

Journal website Publications OpenAlex Indexing certificate Record JSON

Indicators

Lifecycle rating

AJR-E-1.0

Not Yet Rateable

Method

Citation score (PCS)

PCS-1.0

5.69

2022 to 2025, 1,360 items

Adequate sample

Method

Citation impact (PCI)

PCI-1.0

2.56

2023 to 2024, 625 citable items

Adequate sample

Method

PQF (automated)

n/a

Not assessed

Method

Ranked 130/145 in Materials Engineering (PCS-Q4, percentile 10.7), and 2392/4067 overall, by PCS.PCS determines the PCS-Q ranking only; it does not determine Citation Rank, Citation Percentile or Citation Quartile.

Identity

POSI IDposi-data registry/: POSI-J-023392Identifier
eISSNISSN Portal / Crossref: 0040-6090Identifier
pISSNISSN Portal / Crossref: Not recordedIdentifier
OpenAlex sourceOpenAlex: S84339699Identifier
TitleCrossref / OpenAlex: Thin Solid FilmsRegistry
PublisherCrossref / OpenAlex: Elsevier BVRegistry
ISSN countryISSN Portal: Not recordedRegistry

Declared by the publisher

Stated by the journal about itself. POSI records these as declared and does not present them as measured.

Declared countryPublisher: NetherlandsDeclared
LanguagePublisher / DOAJ: EnglishDeclared
FrequencyPublisher: Not recordedDeclared
LicensePublisher / DOAJ: Not recordedDeclared
Peer reviewPublisher: Not recordedDeclared
WebsitePublisher: https://www.sciencedirect.com/science/journal/00406090Declared

Registry and computed values

ArticlesCrossref: 47,367Registry
Open accessDOAJ / OpenAlex: NoRegistry
DOAJ statusDOAJ: Not recordedRegistry
PSC subjectOpenAlex topics → PSC crosswalk: P2.05 Materials EngineeringComputed
PSC confidenceposi-engine: highComputed