Microelectronics Reliability

Elsevier BV, United Kingdom

POSI-J-023463eISSN 0026-2714IndexedPartially verifiedCurrent

Journal website Publications OpenAlex Indexing certificate Record JSON

Indicators

Lifecycle rating

AJR-E-1.0

Not Yet Rateable

Method

Citation score (PCS)

PCS-1.0

5.88

2022 to 2025, 1,180 items

Adequate sample

Method

Citation impact (PCI)

PCI-1.0

2.87

2023 to 2024, 492 citable items

Adequate sample

Method

PQF (automated)

n/a

Not assessed

Method

Ranked 81/93 in Electrical, Electronic and Information Engineering (PCS-Q4, percentile 13.4), and 2341/4067 overall, by PCS.PCS determines the PCS-Q ranking only; it does not determine Citation Rank, Citation Percentile or Citation Quartile.

Identity

POSI IDposi-data registry/: POSI-J-023463Identifier
eISSNISSN Portal / Crossref: 0026-2714Identifier
pISSNISSN Portal / Crossref: Not recordedIdentifier
OpenAlex sourceOpenAlex: S133646729Identifier
TitleCrossref / OpenAlex: Microelectronics ReliabilityRegistry
PublisherCrossref / OpenAlex: Elsevier BVRegistry
ISSN countryISSN Portal: Not recordedRegistry

Declared by the publisher

Stated by the journal about itself. POSI records these as declared and does not present them as measured.

Declared countryPublisher: United KingdomDeclared
LanguagePublisher / DOAJ: EnglishDeclared
FrequencyPublisher: Not recordedDeclared
LicensePublisher / DOAJ: Not recordedDeclared
Peer reviewPublisher: Not recordedDeclared
WebsitePublisher: https://www.sciencedirect.com/science/journal/00262714Declared

Registry and computed values

ArticlesCrossref: 31,062Registry
Open accessDOAJ / OpenAlex: NoRegistry
DOAJ statusDOAJ: Not recordedRegistry
PSC subjectOpenAlex topics → PSC crosswalk: P2.02 Electrical, Electronic and Information EngineeringComputed
PSC confidenceposi-engine: highComputed